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Sachdev Manoj

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits / Manoj Sachdev and Jose Pineda De Gyvez - 2nd Ed. - New Delhi Springer 2007 - xxi, ; 328p. Paperback; 23 cm.

ISBN: 9788184894295

ISSN: 9847

Subjects--Topical Terms:
Logic Design, VLSI 621.395;

Dewey Class. No.: 621.395 / SAC

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