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Integrated Circuit Test Engineering:Modern Techniques
by Grout Ian, A.
Series: Springer Published by : Springer (India) Private Limited (New Delhi) Physical details: xxx, ; 362p. ISBN:9788184890297. ISSN:9898
Subject(s):
Electronic Devices and Circuits 621.3815;
Year: 2006
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.381 5 GRO (Browse shelf) | Reference | 087615 | ||
|
Books
|
RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.381 5 GRO (Browse shelf) | Reference | 087616 | ||
|
Books
|
RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.381 5 GRO (Browse shelf) | Available | 087617 |
Total holds: 0
Browsing RYMEC Shelves , Shelving location: General , Collection code: Electronics and Communication Engineering Close shelf browser
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No cover image available | ||
| 621.381 5 GRA Analysis and Design of Analog Integrated Circuits | 621.381 5 GRA Analysis and Design of Analog Integrated Circuits | 621.381 5 GRO Integrated Circuit Test Engineering:Modern Techniques | 621.381 5 GRO Integrated Circuit Test Engineering:Modern Techniques | 621.381 5 GRO Integrated Circuit Test Engineering:Modern Techniques | 621.381 5 HOD Analysis and Design of Digital Integrated Circuits | 621.381 5 HOD Analysis and Design of Digital Integrated Circuits |
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