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VLSI Design and Technology
by Roy J.N.
Additional authors:
Bose D.N.
Published by :
New Age International Pvt. Limited Publishers
(New Delhi)
Physical details: xiv, ; 488p.
ISBN:9788122430646.
ISSN:9909
Subject(s):
Logic Design, VLSI 621.395;
Year: 2011
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.395 ROY (Browse shelf) | Reference | 087648 | ||
|
Books
|
RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.395 ROY (Browse shelf) | Reference | 087649 | ||
|
Books
|
RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.395 ROY (Browse shelf) | Available | 087650 |
Total holds: 0
Browsing RYMEC Shelves , Shelving location: General , Collection code: Electronics and Communication Engineering Close shelf browser
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| 621.395 ROT Fundamentals of Logic Design | 621.395 ROY VLSI Design and Technology | 621.395 ROY VLSI Design and Technology | 621.395 ROY VLSI Design and Technology | 621.395 SAC Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | 621.395 SAC Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | 621.395 SAC Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits |
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