TY  - BOOK
AU  - Sachdev Manoj
AU  - Gyvez Jose Pineda De
TI  - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
SN  - 9788184894295
SN  - 9847
U1  - 621.395             
PY  - 2007///
CY  - New Delhi
PB  - Springer
KW  - Logic Design, VLSI 621.395
ER  -