Normal view MARC view ISBD view

Integrated Circuit Test Engineering:Modern Techniques

by Grout Ian, A.
Series: Springer Published by : Springer (India) Private Limited (New Delhi) Physical details: xxx, ; 362p. ISBN:9788184890297. ISSN:9898 Year: 2006
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
Item type Current location Collection Call number Status Date due Barcode Item holds
Books Books RYMEC

Rao Bahadur Y. Mahabaleswarappa Engineering College

Cantonment

BALLARI

General
Electronics and Communication Engineering 621.381 5 GRO (Browse shelf) Reference 087615
Books Books RYMEC

Rao Bahadur Y. Mahabaleswarappa Engineering College

Cantonment

BALLARI

General
Electronics and Communication Engineering 621.381 5 GRO (Browse shelf) Reference 087616
Books Books RYMEC

Rao Bahadur Y. Mahabaleswarappa Engineering College

Cantonment

BALLARI

General
Electronics and Communication Engineering 621.381 5 GRO (Browse shelf) Available 087617
Total holds: 0

There are no comments for this item.

Log in to your account to post a comment.
Maintained by LIS ACADEMY, Bengaluru