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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
by Sachdev Manoj
Additional authors:
Gyvez Jose Pineda De
Edition statement:2nd Ed.
Published by :
Springer
(New Delhi)
Physical details: xxi, ; 328p.
ISBN:9788184894295.
ISSN:9847
Subject(s):
Logic Design, VLSI 621.395;
Year: 2007
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.395 SAC (Browse shelf) | Reference | 087459 | ||
|
Books
|
RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.395 SAC (Browse shelf) | Reference | 087460 | ||
|
Books
|
RYMEC
Rao Bahadur Y. Mahabaleswarappa Engineering College Cantonment BALLARI |
Electronics and Communication Engineering | 621.395 SAC (Browse shelf) | Available | 087461 |
Total holds: 0
Browsing RYMEC Shelves , Shelving location: General , Collection code: Electronics and Communication Engineering Close shelf browser
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| 621.395 ROY VLSI Design and Technology | 621.395 ROY VLSI Design and Technology | 621.395 SAC Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | 621.395 SAC Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | 621.395 SAC Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | 621.395 SAM Logic Design | 621.395 SAM Logic Design |
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